Study of Tip-Induced Ti-Film Oxidation in Atomic Force Microscopy Contact and Non-Contact Mode
نویسندگان
چکیده
منابع مشابه
Can atomic force microscopy achieve atomic resolution in contact mode?
Atomic force microscopy operating in the contact mode is studied using total-energy pseudopotential calculations. It is shown that, in the case of a diamond tip and a diamond surface, it is possible for a tip terminated by a single atom to sustain forces in excess of 30 nN. It is also shown that imaging at atomic resolution may be limited by blunting of the tip during lateral scanning.
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Noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation ~.200 kHz; ;1 nm! is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system ~50 kHz!. We call ...
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ژورنال
عنوان ژورنال: Acta Physica Polonica A
سال: 2003
ISSN: 0587-4246,1898-794X
DOI: 10.12693/aphyspola.103.553